Advances in Traceable Nanoscale Metrology was a talk by Prof. Richard Leach from NPL that I heard with great interest at the Institute of Physics in March 09. I have uploaded the 50 slides in 5 parts and will create my equivalent to compare and contrast.
I have not investigated how the measuring units of my 3D metric framework may be traceable to the basic SI units m / kg / sec, because there are too many of them, and the ‘routes’ to the SI units will vary.
But key is the absence of uncertainty: every data set will reveal the same numerical correlations, and every image the same newness of qualities that can be investigated numerically with ‘software vision’.
And I have investigated how ‘3dM qualities’ address problems that can currently not be solved: depending on the context and scale, they quantify ‘nesses’ or qualities such as different kinds of
- and softness
or the qualities of materials such as
or whatever one is looking for in an image or by comparing multi-dimensional data and microscopic images.